Chinese Optics Letters, Volume. 8, Issue s1, 99(2010)
Dispersive white-light spectral interferometer for optical properties measurement of optical thin films
[1] [1] V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, Opt. Express 17, 7943 (2009).
[2] [2] P. Hlubina, D. Ciprian, J. Lunacek, and M. Lesnak, Opt. Express 14, 7678 (2006).
[4] [4] P. Hlubina, J. Lunacek, and D. Ciprian, Opt. Lett. 34, 1564 (2009).
[5] [5] A. Gosteva, M. Haiml, R. Paschotta, and U. Keller, J. Opt. Soc. Am. B 22, 1868 (2005).
[6] [6] T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, Appl. Opt. 48, 949 (2009).
[7] [7] K. Alexander, F. Chau, and J. B. Gao, Ana. Chem. 70, 5222 (1998).
[8] [8] J. W. Luo, J. Bai, and J. H. Shao, Prog. Nat. Sci. 16, (2006).
Get Citation
Copy Citation Text
Zhengyue Luo, Xu Liu, Shuna Zhang, Weidong Shen, Cen Xia, Yi Yin, "Dispersive white-light spectral interferometer for optical properties measurement of optical thin films," Chin. Opt. Lett. 8, 99 (2010)
Received: Nov. 30, 2009
Accepted: --
Published Online: May. 14, 2010
The Author Email: