Chinese Optics Letters, Volume. 8, Issue s1, 99(2010)

Dispersive white-light spectral interferometer for optical properties measurement of optical thin films

Zhengyue Luo, Xu Liu, Shuna Zhang, Weidong Shen, Cen Xia, and Yi Yin
Author Affiliations
  • State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China
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    References(8)

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    [5] [5] A. Gosteva, M. Haiml, R. Paschotta, and U. Keller, J. Opt. Soc. Am. B 22, 1868 (2005).

    [6] [6] T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, Appl. Opt. 48, 949 (2009).

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    Zhengyue Luo, Xu Liu, Shuna Zhang, Weidong Shen, Cen Xia, Yi Yin, "Dispersive white-light spectral interferometer for optical properties measurement of optical thin films," Chin. Opt. Lett. 8, 99 (2010)

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    Paper Information

    Received: Nov. 30, 2009

    Accepted: --

    Published Online: May. 14, 2010

    The Author Email:

    DOI:10.3788/COL201008s1.0099

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