Design of Performance Test System and Analysis of Temperature Dependence for Space-Borne Array CCD

Yao Pingping; Xu Sunlong; Tu Bihai; Yu Xinyu; Cui Shanshan; Luo Donggen; Hong Jin

doi:10.3788/CJL202047.0910001

Chinese Journal of Lasers, Volume. 47, Issue 9, 910001(2020)

Design of Performance Test System and Analysis of Temperature Dependence for Space-Borne Array CCD

Yao Pingping^1,2, Xu Sunlong^1,2, Tu Bihai^1,2, Yu Xinyu^1,2, Cui Shanshan^1,2, Luo Donggen^1,2, and Hong Jin^1,2

Author Affiliations

¹Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China

²Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences,Hefei, Anhui 230031, China

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Figures & Tables(13)

Fig. 1. Schematic of electro-optical test system of array CCD

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Fig. 2. Block diagram of array CCD image acquisition system

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Fig. 3. Schematic of cooling system of array CCD detector

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Fig. 4. Integrating sphere illumination non-uniformity test result

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Fig. 5. Refrigeration control results. (a) Temperature control curve; (b) different working temperatures

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Fig. 6. Curves of dark current and temperature

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Fig. 7. QE curves change results at different working temperatures

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Fig. 8. QE of DPC under different working temperatures

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Table 1. Radiation stability test results of integrating sphere light source
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Table 1. Radiation stability test results of integrating sphere light source
Wavelength /nm 490 565 670 763 765 865 910 Avarage
Stability /% 0.036 0.032 0.049 0.017 0.060 0.047 0.014 0.036

Table 2. Measurement results of integration time accuracy
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Table 2. Measurement results of integration time accuracy
Requirement /ms 0±0.005 5±0.005 75±0.005 200±0.005 300±0.005
Measurement /ms 0 5.0029 75.0039 200.0032 300.0021

Table 3. Measurement results of inconsistency of light response at different wavelengths
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Table 3. Measurement results of inconsistency of light response at different wavelengths
Wavelength /nm 443 490 565 670 763 765 865 910
PRNU /% 2.76 1.88 1.62 2.07 2.36 2.03 2.62 2.73
Manufacturer data /% 2.8(400 nm) - - 2.5(650 nm) - - - 2.8(900 nm)
Limits ≤3% ≤5%

Table 4. Photoelectric performance parameter test results of detector

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Table 4. Photoelectric performance parameter test results of detector

Parameter	Unit	Result	Manufacturer data	Limit
Systemga	DN·electron^-1	0.025	-	≤0.049
Saturation gray value	DN	3200	-	≥2000
Full well capacity	1×10³ electron ·pixel^-1	128	120	≥80
Readout noise	electron	2.980	2.9	≤4
Max signal noise ratio		346	-	≤357
Dark current	electron·pixel^-1·s^-1	1011.776	1118	6 ℃,≤5779.5
Dark signal nonuniformity	electron·pixel^-1·s^-1	20	267	6 ℃,≤578
Defect pixel (white spot, black spot)		0	0	≤50

Table 5. Detector optical response nonlinearity and QE test results

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Table 5. Detector optical response nonlinearity and QE test results

Parameter	Wavelength /nm	Unit	Result	Manufacturer data	Limit
Linearity rrror	443	%	0.73	-	≤1
		490			0.23
		565			0.40
		670			0.30
		763			0.62
		765			0.19
		865			0.15
		910			0.30
QE	400	%	57.89	61.8	≥40
		500	89.60	90.7	≥80
		650	87.77	89.5	≥80
		900	27.03	29.6	≥25

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Yao Pingping, Xu Sunlong, Tu Bihai, Yu Xinyu, Cui Shanshan, Luo Donggen, Hong Jin. Design of Performance Test System and Analysis of Temperature Dependence for Space-Borne Array CCD[J]. Chinese Journal of Lasers, 2020, 47(9): 910001

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