Acta Optica Sinica, Volume. 25, Issue 4, 572(2005)
Properties of Tetrahedral Amorphous Carbon Films Characterized By X-Ray Reflectivity Technique
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Properties of Tetrahedral Amorphous Carbon Films Characterized By X-Ray Reflectivity Technique[J]. Acta Optica Sinica, 2005, 25(4): 572
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