Spectroscopy and Spectral Analysis, Volume. 41, Issue 7, 2148(2021)
Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector
References(6)
[2] Horiuchi T, Yoneda Y[D]. Review of Scientific Instruments, 42, 1069(1971).
[3] Meirer F, Pepponi G, Pianetta P, Singh A et al[D]. TrAC Trends in Analytical Chemistry, 29, 479(2010).
[5] Lei Jiarong, Zhou Jianbin, Zhou Wei et al[D]. Nuclear Science and Techniques, 23, 150(2012).
[6] Li Zhuodai, Tang Bin, Zhang Huaiqiang et al[D]. Nuclear Science and Techniques, 30, 108(2019).
[7] Ge Liangquan, Ge Qing, Yuan Hongwen et al[D]. Nuclear Science and Techniques, 26, 010402(2015).
[8] Ge Liangquan, Tang Bin, Zhang Huaiqiang et al[D]. Nuclear Science and Techniques, 24, 060407(2013).
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He-xi WU, Run-jie DI, Yu-juan LIU, Hui XU, Yi-bao LIU. Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector[J]. Spectroscopy and Spectral Analysis, 2021, 41(7): 2148
Paper Information
Category: Research Articles
Received: May. 31, 2020
Accepted: --
Published Online: Sep. 8, 2021
The Author Email: He-xi WU (wujing-7758@163.com)
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