Spectroscopy and Spectral Analysis, Volume. 41, Issue 7, 2148(2021)

Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector

He-xi WU1、*, Run-jie DI2、2;, Yu-juan LIU1、1; 2;, Hui XU2、2;, and Yi-bao LIU2、2; *;
Author Affiliations
  • 11. Engineering Research Center of Nuclear Technology Application (East China University of Technology), Ministry of Education, Nanchang 330013, China
  • 22. School of Nuclear Science and Engineering, East China University of Technology, Nanchang 330013, China
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    References(6)

    [2] T Horiuchi, Y Yoneda. Review of Scientific Instruments, 42, 1069(1971).

    [3] F Meirer, G Pepponi, P Pianetta, A Singh et al. TrAC Trends in Analytical Chemistry, 29, 479(2010).

    [5] Jiarong Lei, Jianbin Zhou, Wei Zhou et al. Nuclear Science and Techniques, 23, 150(2012).

    [6] Zhuodai Li, Bin Tang, Huaiqiang Zhang et al. Nuclear Science and Techniques, 30, 108(2019).

    [7] Liangquan Ge, Qing Ge, Hongwen Yuan et al. Nuclear Science and Techniques, 26, 010402(2015).

    [8] Liangquan Ge, Bin Tang, Huaiqiang Zhang et al. Nuclear Science and Techniques, 24, 060407(2013).

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    He-xi WU, Run-jie DI, Yu-juan LIU, Hui XU, Yi-bao LIU. Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector[J]. Spectroscopy and Spectral Analysis, 2021, 41(7): 2148

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    Paper Information

    Category: Research Articles

    Received: May. 31, 2020

    Accepted: --

    Published Online: Sep. 8, 2021

    The Author Email: WU He-xi (wujing-7758@163.com)

    DOI:10.3964/j.issn.1000-0593(2021)07-2148-05

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