Remote Sensing Technology and Application, Volume. 39, Issue 3, 612(2024)

Recognition of Typical Objects in Chemical Industry Parks Using BASS-Net based on High-resolution Remote Sensing Images

Weiwei SUN, Jie LIU, Fangfang ZHANG, Haiyi MA, Changkun WANG, and Xianzhang PAN
Author Affiliations
  • State Key Laboratory of Soil and Sustainable Agriculture, Institute of Soil Science, Chinese Academy of Sciences, Nanjing210008, China
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    Figures & Tables(11)
    Remote sensing images of chemical industry parks and labels of typical objects
    Statistics on the number of pixels for each typical object
    Examples of remote sensing images for some typical objects in chemical industry park
    Block diagram of the BASS-Net architecture[19]
    Confusion matrix of model recognition effect
    Training curves using different learning rate
    Statistics on the precision, recall and F1 of BASS-Net with different convolutional kernel width
    Recognition outputs of three different models and corresponding remote sensing image
    • Table 1. Statistics on the precision, recall and F1 for different typical objects

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      Table 1. Statistics on the precision, recall and F1 for different typical objects

      地物类别精确度/%召回率/%F1分数/%
      储存罐97.2996.4496.86
      生产厂房98.2796.3897.31
      办公楼93.0396.1294.55
      蓄水池100.00100.00100.00
      运输装卸区98.1498.8998.51
      露天生产设备94.9793.7894.37
      露天管道96.3998.8097.58
      露天堆积货物98.2898.6598.46
      港口货船96.0698.4797.25
      烟囱97.1698.1397.64
      风机95.8397.4096.61
      冷却塔96.1696.0896.12
      裸地99.1297.8998.50
      绿地99.2899.0999.18
      农用地98.3799.4898.92
      居民楼95.4097.9596.66
      自然水体99.0699.7999.43
      硬化路面96.3396.3096.31
    • Table 2. Parameters of three algorithms

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      Table 2. Parameters of three algorithms

      算法参数设置
      RF树的个数:500,max_features = sqrt
      SVM核函数:RBF,惩罚系数:0.1,γ=10
      BASS-Net损失函数:交叉熵损失函数,优化器:Adam,学习率:0.1,卷积核大小:11×11,epoch=50,batch_size=500
    • Table 3. Comparison of results for different models

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      Table 3. Comparison of results for different models

      准确率/%精确度/%召回率/%F1分数/%
      RF56.2945.7243.6842.96
      SVM83.8271.6375.2272.66
      BASS-Net97.3097.1797.7697.46
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    Weiwei SUN, Jie LIU, Fangfang ZHANG, Haiyi MA, Changkun WANG, Xianzhang PAN. Recognition of Typical Objects in Chemical Industry Parks Using BASS-Net based on High-resolution Remote Sensing Images[J]. Remote Sensing Technology and Application, 2024, 39(3): 612

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    Paper Information

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    Received: Oct. 13, 2022

    Accepted: --

    Published Online: Dec. 9, 2024

    The Author Email:

    DOI:10.11873/j.issn.1004-0323.2024.3.0612

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