High Power Laser and Particle Beams, Volume. 37, Issue 5, 052004(2025)

Simulation research on high resolution X-ray diagnosis technology based on diffraction imaging

Jinbo Li, Jie Xu*, Baozhong Mu, and Xin Wang
Author Affiliations
  • Department of Physics, Tongji University, Shanghai 200092, China
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    References(15)

    [4] Chen Zhifeng. Liang Quanting, Physical Optics[J]. Guide to Knowledge, 155(2017).

    [5] [5] Bn M, Wolf E. Principles of optics: electromagic they of propagation, interference diffraction of light[M]. 7th ed. Cambridge: Cambridge University Press, 2013.

    [11] [11] Attwood D. Soft Xrays extreme ultraviolet radiation: principles applications[M]. Cambridge: Cambridge University Press, 1999.

    [14] [14] Guilbaud O, Edwards M, Klisnick A, et al. Nearfield imaging of Nilike silver transient collisional Xray laser[C]Soft XRay Lasers Applications V. 2003: 1728.

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    Jinbo Li, Jie Xu, Baozhong Mu, Xin Wang. Simulation research on high resolution X-ray diagnosis technology based on diffraction imaging[J]. High Power Laser and Particle Beams, 2025, 37(5): 052004

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    Paper Information

    Category: Special Column of 4th Symposium on Frontier of HPLPB

    Received: Aug. 19, 2024

    Accepted: Feb. 15, 2025

    Published Online: May. 22, 2025

    The Author Email: Jie Xu (1310581@tongji.edu.cn)

    DOI:10.11884/HPLPB202537.240269

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