Terahertz Probe System for Electronically Controlled Optical Sampling Based on Piecewise Voltage Function

Fan Huang; Yi Xu; Wanying Liu; Jing Zhang; Yinpeng Chen; Xueqian Zhang; Quan Xu; Liyuan Liu; Jianqaing Gu

doi:10.3788/AOS250815

Acta Optica Sinica, Volume. 45, Issue 15, 1511004(2025)

Terahertz Probe System for Electronically Controlled Optical Sampling Based on Piecewise Voltage Function

Fan Huang, Yi Xu, Wanying Liu, Jing Zhang, Yinpeng Chen, Xueqian Zhang, Quan Xu, Liyuan Liu, and Jianqaing Gu^*

Center for Terahertz Waves, Key Laboratory of Optoelectronics Information Technology, Ministry of Education, School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China

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Fan Huang, Yi Xu, Wanying Liu, Jing Zhang, Yinpeng Chen, Xueqian Zhang, Quan Xu, Liyuan Liu, Jianqaing Gu. Terahertz Probe System for Electronically Controlled Optical Sampling Based on Piecewise Voltage Function[J]. Acta Optica Sinica, 2025, 45(15): 1511004

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Paper Information

Category: Imaging Systems

Received: Mar. 31, 2025

Accepted: May. 19, 2025

Published Online: Aug. 15, 2025

The Author Email: Jianqaing Gu (gjq@tju.edu.cn)

DOI:10.3788/AOS250815

CSTR:32393.14.AOS250815

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology