Photonics Research, Volume. 2, Issue 2, 51(2014)
False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments
Fig. 1. Schematic of the far-field external cavity feedback influence on an LD: (a) detailed external feedback structure, (b) effective internal LD structure.
Fig. 2. Relationship among
Fig. 3. Geometric simplification of laser beam propagation at different sample positions: (a) before the focal plane, (b) on the focal plane, (c) after the focal plane.
Fig. 4. Normalized reflected light power
Fig. 6. Relationship among LD output power,
Fig. 7. Detailed illustration of the effective LD output with an attenuator.
Fig. 8. Relationship of
Fig. 9. Comparison of feedback influence with different attenuation values.
Fig. 10. Reduction of feedback light influence on open-aperture
Fig. 11. Reduction of feedback light influence on closed-aperture
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Hui Yan, and Jingsong Wei, "False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments," Photonics Res. 2, 51 (2014)
Category: Nonlinear Optics
Received: Dec. 3, 2013
Accepted: Jan. 23, 2014
Published Online: Nov. 5, 2014
The Author Email: and Jingsong Wei (weijingsong@siom.ac.cn)