[1] WANG Ang, GUO Feng, ZHU Zhiwu et al. Comparative study of hard CMOS damage irradiated by CW laser and single-pulse ns laser[J]. High Power Laser and Particle Beams, 26, 49-53(2014).

[2] SHAO Ming, ZHANG Le, ZHANG Leilei et al. Comparative study on saturation effect of 1.06 μm laser jamming CCD and CMOS cameras[J]. Journal of Applied Optics, 35, 163-167(2014).

[3] GAO Run, NIU Chunhui, LI Xiaoying. Experiment and mechanism analysis of 632 nm laser jamming CCD and CMOS[J]. Laser Journal, 37, 5-9(2016).

[4] ZHU Mengzhen, LIU Yun, MI Chaowei et al. Experimental study on a CMOS image sensor damaged by a composite laser[J]. Infrared and Laser Engineering, 51, 3788(2022).

[5] HAN Min, NIE Jinsong, DOU Xian'an et al. Temporal evolution characteristics of CCD detector based on different laser loading methods[J]. Chinese Journal of Luminescence, 40, 788-794(2019).

[6] ZHANG Qiaoyun, CHEN Qingshan, NIU Chunhui. Jamming mechanism analysis of laser thermal effect on CMOS detector[J]. Laser Journal, 39, 72-76(2018).

[7] ZHANG Tao, LI Xinyang, LI Jianfeng et al. sCMOS real-time nonuniformity correction based on adaptive multipoint method[J]. Opto-Electronic Engineering, 48, 210036(2021).

[8] WEN Jiaqi, BIAN Jintian, LI Xin et al. Research progress of laser dazzle and damage CMOS image sensor (invited)[J]. Infrared and Laser Engineering, 52, 3788(2023).

[9] JIANG Nan, ZHANG Chu, NIU Yanxiong et al. Numerical simulation of pulsed laser induced damage on CCD arrays[J]. Laser & Infrared, 38, 1004-1007(2008).

[10] BI Juan, ZHANG Xihe, NI Xiaowu. Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor[J]. Acta Physica Sinica, 60, 340-345(2011).

[11] HE Yuejuan, PENG Qing, ZHANG Wei. Analysis of the laser-induced circumferential thermal stress fields in hollow metal cylinders by finite element method[J]. Applied Laser, 29, 317-319(2009).

[12] LI Z W, WANG X, SHEN Z H et al. Mechanisms for the millisecond laser-induced functional damage to silicon charge-coupled imaging sensors[J]. Applied Optics, 54, 378-388(2015).