Microelectronics, Volume. 51, Issue 4, 603(2021)
ESD Failure Analysis and Improvement of a Special Digital Circuit for Multi-Power Supply Domain
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QIAN Lingli, HUANG Wei. ESD Failure Analysis and Improvement of a Special Digital Circuit for Multi-Power Supply Domain[J]. Microelectronics, 2021, 51(4): 603
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Received: Oct. 11, 2020
Accepted: --
Published Online: Feb. 21, 2022
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