OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 18, Issue 1, 34(2020)
Micro-Smooth Surface Measurement Method Based on Modulation Measurement Profilometry
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LI Yun, LIU Yuan-kun, ZHAN Zheng-yi. Micro-Smooth Surface Measurement Method Based on Modulation Measurement Profilometry[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2020, 18(1): 34
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Received: Jun. 21, 2019
Accepted: --
Published Online: Aug. 8, 2020
The Author Email: Yun LI (2473974881@qq.com)
CSTR:32186.14.
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