Acta Optica Sinica, Volume. 42, Issue 2, 0212003(2022)

Research and Accuracy Verification of Linear Polarization Measurement Technology Based on Spectral Modulation

jingjing Shi1,2, Yadong Hu2、*, Mengfan Li2, Wuhao Liu1,2, and Jin Hong1,2
Author Affiliations
  • 1School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 2Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China
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    Figures & Tables(16)
    Block diagram of SM polarization measurement system
    Simulation of spectral modulation process. (a) Normalization parameters of incident linear polarized light; (b) simulation curve of modulation spectrum
    Influence of spectral broadening on modulation spectrum. (a) Comparison of original modulation spectrum and convolved spectrum; (b) curve of polarimetric efficiency
    Schematic diagram of experimental set-up
    Calibration site of relative response coefficient
    Spectra of dual-channel unpolarized light
    Original spectrum of 0° reference linear polarized light
    Modulation function of 0° reference linear polarized light. (a) Modulation function; (b) fitting residual error
    Retardation of multiple-order wave plate
    Polarimetric efficiency of 0° reference linear polarized light
    Polarimetric efficiency of system
    Experiment site for polarization measurement accuracy verification of system
    Theoretical outputs and measurement results of VPOLS. (a) Original spectra; (b) modulation function; (c) measurement error of AoLP; (d) measurement value of DoLP and its error
    Measurement results when VPOLS rotation angle is 38.3°. (a) DoLP varying with wavelength; (b) AoLP error varying with wavelength
    Measurement results when VPOLS rotation angle is 59.0°. (a) DoLP varying with wavelength; (b) AoLP error varying with wavelength
    • Table 1. Error statistics between measured value and theoretical value

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      Table 1. Error statistics between measured value and theoretical value

      Rotation angle /(°)Maximum of DoLP error /%Maximum of AoLP error /(°)
      38.30.2820.57
      51.00.6220.70
      59.01.1100.48
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    jingjing Shi, Yadong Hu, Mengfan Li, Wuhao Liu, Jin Hong. Research and Accuracy Verification of Linear Polarization Measurement Technology Based on Spectral Modulation[J]. Acta Optica Sinica, 2022, 42(2): 0212003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 2, 2021

    Accepted: Aug. 9, 2021

    Published Online: Dec. 29, 2021

    The Author Email: Hu Yadong (huyadong@aiofm.ac.cn)

    DOI:10.3788/AOS202242.0212003

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