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Chinese Optics Letters, Volume. 4, Issue 9, 515(2006)

Simple Strehl ratio based method for pupil phase mask's optimization in wavefront coding system

Wenzi Zhang, Yanping Chen, Tingyu Zhao, Zi Ye, and Feihong Yu*
Author Affiliations
  • State Key Laboratory of Modern Optical Instrumentation, Optical Engineering Department, Zhejiang University, Hangzhou 310027
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    [1] [1] E. R. Dowski and W. T. Cathey, Appl. Opt. 34, 1859 (1995).

    [2] [2] W. T. Cathey and E. R. Dowski, Appl. Opt. 41, 6080 (2002).

    [3] [3] R. Narayanswamy and P. E. Silveira, Proc. SPIE 6202, 62020G (2006).

    [4] [4] S. Prasad, T. C. Torgersen, V. P. Pauca, R. J. Plemmons, and J. van der Gracht, Proc. SPIE 5108, 1 (2003).

    [5] [5] L. Ingber, Control and Cybernetics 25, 33 (1996).

    [6] [6] M. Subbarao, T.-S. Choi, and A. Nikzad, Opt. Eng. 32, 2824 (1993).

    CLP Journals

    [1] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Spot Diagram Analysis for Wavefront Coding Imaging Systems with an Odd-Symmetrical Phase Plate[J]. Acta Optica Sinica, 2007, 27(9): 1621

    [2] Feng Yan, Di Fan, Binzhi Zhang, Longhai Yin, Ruigang Li, Xuejun Zhang, "Manufacturing and testing of a cubic SiC surface," Chin. Opt. Lett. 7, 06534 (2009)

    [3] Pan Chao, Chen Jiabi, Zhang Rongfu, Zhuang Songlin. Extension Ratio of the Depth of Field for Wavefront Coding Imaging System[J]. Acta Optica Sinica, 2008, 28(5): 870

    [4] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], "Focal depth extending using rotational symmetric pupil masks," Chin. Opt. Lett. 5, 71 (2007)

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    Wenzi Zhang, Yanping Chen, Tingyu Zhao, Zi Ye, Feihong Yu, "Simple Strehl ratio based method for pupil phase mask's optimization in wavefront coding system," Chin. Opt. Lett. 4, 515 (2006)

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    Paper Information

    Received: May. 15, 2006

    Accepted: --

    Published Online: Sep. 14, 2006

    The Author Email: Feihong Yu (yufeihong@gmail.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology