Acta Photonica Sinica, Volume. 52, Issue 2, 0212004(2023)

F/0.78 High Order Aspheric Surface Testing with Null Compensator and Mapping Distortion Correction

Sanfeng HAO1,2, Jian ZHANG1,3、*, and Jianfeng YANG1
Author Affiliations
  • 1Xi'an Institute of Optics and Precision Mechanics,Chinese Academy of Science,Xi'an 710119,China
  • 2University of Chinese Academy of Sciences,Beijing 100049,China
  • 3Xidian University,School of Mechano-electronic Engineering,Xi'an 710071,China
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    Sanfeng HAO, Jian ZHANG, Jianfeng YANG. F/0.78 High Order Aspheric Surface Testing with Null Compensator and Mapping Distortion Correction[J]. Acta Photonica Sinica, 2023, 52(2): 0212004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 16, 2022

    Accepted: Sep. 28, 2022

    Published Online: Mar. 28, 2023

    The Author Email: Jian ZHANG (zj@opt.ac.cn)

    DOI:10.3788/gzxb20235202.0212004

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