Acta Photonica Sinica, Volume. 52, Issue 2, 0212004(2023)
F/0.78 High Order Aspheric Surface Testing with Null Compensator and Mapping Distortion Correction
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Sanfeng HAO, Jian ZHANG, Jianfeng YANG. F/0.78 High Order Aspheric Surface Testing with Null Compensator and Mapping Distortion Correction[J]. Acta Photonica Sinica, 2023, 52(2): 0212004
Category: Instrumentation, Measurement and Metrology
Received: Sep. 16, 2022
Accepted: Sep. 28, 2022
Published Online: Mar. 28, 2023
The Author Email: Jian ZHANG (zj@opt.ac.cn)