Measurement Technology of Time of Flight Based on Gated Microchannel Plates

Houzhi Cai; Jinyuan Liu; Wenyong Fu; Yunfei Lei; Yubo Liao; Jinghua Long

doi:10.3788/AOS201838.0204002

Acta Optica Sinica, Volume. 38, Issue 2, 0204002(2018)

Measurement Technology of Time of Flight Based on Gated Microchannel Plates

Houzhi Cai¹, Jinyuan Liu¹, Wenyong Fu¹, Yunfei Lei¹, Yubo Liao¹, and Jinghua Long^2、*

¹ Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen, Guangdong 518060, China

² College of Physics and Energy, Shenzhen University, Shenzhen, Guangdong 518060, China

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Houzhi Cai, Jinyuan Liu, Wenyong Fu, Yunfei Lei, Yubo Liao, Jinghua Long. Measurement Technology of Time of Flight Based on Gated Microchannel Plates[J]. Acta Optica Sinica, 2018, 38(2): 0204002

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Paper Information

Category: Detectors

Received: Aug. 11, 2017

Accepted: --

Published Online: Aug. 30, 2018

The Author Email: Long Jinghua (jhlong@szu.edu.cn)

DOI:10.3788/AOS201838.0204002

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