Journal of Infrared and Millimeter Waves, Volume. 43, Issue 6, 762(2024)

Research on polarization control of MOPA semiconductor laser

Hao-Miao WANG1,2, Yu-Wen HE1,2, Yi LI1,2, Yao HU1,2, Liang ZHANG1,2, Wei-Chuan DU1,2、*, Song-Xin GAO1,2, Chun TANG1,2, Xiao-Yu MA3, and Su-Ping LIU3
Author Affiliations
  • 1The Key Laboratory of Science and Technology on High Energy Laser,China Academy of Engineering Physics,Mianyang 621900,China
  • 2Institute of Applied Electronics,China Academy of Engineering Physics,Mianyang 621900,China
  • 3Institute of Semiconductor,Chinese Academy of Sciences,Beijing 100083,China
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    Figures & Tables(6)
    (a)Refractive index and calculated optical field distribution diagram of 980 nm semiconductor laser;(b)schematic diagram of MOPA structure
    (a)The variation of the optical confinement factor of TE00-mode and TM00-mode in ridge waveguide with etched depth;(b)the trend of degree of polarization variation of ridge section under different etching depths;(c)the total power and TE-mode power varing from etching depths.
    (a)The trend curve of the power,polarization angle and degree of polarization of tapered waveguide with stress;(b)emission spectrum of taper section with different stress
    (a)The influence of PN metal thickness difference on DOP and polarization angle of MOPA;(b)Dop and polarization angle of ridge,toper and MOPA
    (a)The power and DOP(b)voltage and efficiency of MOPA lasers as a function of PA current before and after enhancement
    The impact of heat sink temperature on the power and DOP of MOPA device
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    Hao-Miao WANG, Yu-Wen HE, Yi LI, Yao HU, Liang ZHANG, Wei-Chuan DU, Song-Xin GAO, Chun TANG, Xiao-Yu MA, Su-Ping LIU. Research on polarization control of MOPA semiconductor laser[J]. Journal of Infrared and Millimeter Waves, 2024, 43(6): 762

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    Paper Information

    Category: Infrared Physics, Materials and Devices

    Received: Aug. 29, 2023

    Accepted: --

    Published Online: Dec. 13, 2024

    The Author Email: Wei-Chuan DU (weichuandu@126.com)

    DOI:10.11972/j.issn.1001-9014.2024.06.006

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