[1] [1] P. K. Rastogi. Digital Speckle Pattern Interferometry and Related Techniques[M]. England: John Wiley & Sons Ltd, 2001

[2] [2] Paul D. Plotkowski, Yau Y. Hung, Joseph D. Hovanesian et al.. Improved fringe carrier technique for unambiguous determination of holographically recorded displacements[J]. Opt. Engng., 1985, 24(5): 754～756

[3] [3] D. R. Matthys, J. A. Gilbert, T. D. Dudderar et al.. A windowing technique for the automated analysis of holo-interferograms[J]. Opt. Laser Engng., 1988, 8(2): 123～136

[4] [4] Thomas R. Judge, Chenggen Quan, Peter J. Bryanston-Cross. Holographic deformation measurements by Fourier transform technique with automatic phase unwrapping[J]. Opt. Engng., 1992, 31(3): 533～543

[5] [5] B. Han, D. Post. The tilted-plate method for introducing carrier fringes of extension in moire interferometry[J]. Exp. Technol., 1989, 13(7): 25～29

[6] [6] A. Davila, D. Kerr, G. H. Kaufmann. Fast electro-optical system for pulsed ESPI carrier fringe generation[J]. Opt. Commun., 1996, 123(2): 457～464

[7] [7] Yu Fu, Cho Jui Tay, Chenggen Quan et al.. Wavelet analysis of speckle patterns with a temporal carrier[J]. Appl. Opt., 2005, 44(6): 959～965

[8] [8] Sun Ping, Tao Chunxian, Zhang Li et al.. Spatial modulation for electronic speckle patterns and its demodulation[J]. Optoelectronics Lett., 2005, 1(2): 141～143

[12] [12] Sun Ping, Zhang Xi, Wang Haifeng. Study on combined method based on 3-D ESPI[J]. Chin. J. Lasers, 2002, B11(3): 189～192

[13] [13] William W. Macy, Jr. Two-dimensional fringe-pattern analysis[J]. Appl. Opt., 1983, 22(23): 3898～3901

[14] [14] Donald J. Bone, H. A. Bachor, R. John Sandeman. Fringe-pattern analysis using a 2-D Fourier transform[J]. Appl. Opt., 1986, 25(10): 1653～1660