Opto-Electronic Engineering, Volume. 31, Issue 1, 40(2004)

Design and research of constant percussive force atomic force microscope in tapping mode

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(4)

    [2] [2] ZHONG Q,INNISS D,KJOLLER K,et al. Fractured polymer / silica fiber surface studied by tapping mode atomic force microscopy [J]. Surface Science Letters, 1993, 290(1-2):688-692.

    [3] [3] WANG Lu-gen. The role of damping in phase imaging in tapping mode atomic force microscopy [J]. Surface Science, 1998, 429(1-3): 178-185.

    [5] [5] ANCZYKOWSKI B,KRUGER D,FUCHS H. Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects [J]. Physical Review B, 1996,53(23):15485-15488.

    [6] [6] KATO N,KIKUTA H,NAKANO T,et al. System analysis of the force-feedback method for force curve measurements[J]. Review of Science Instruments, 1999, 70 (5): 2402-2407.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Design and research of constant percussive force atomic force microscope in tapping mode[J]. Opto-Electronic Engineering, 2004, 31(1): 40

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    Paper Information

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    Received: Mar. 29, 2003

    Accepted: --

    Published Online: Nov. 14, 2007

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