[1] [1] Zhu Qunzhi. Modeling and Measurements of the Bidirectional Reflectance of Microrough Silicon Surfaces[D]. Georgia:School of Mechanical Engineering,Georgia Institute of Technology,2004,1-12

[2] [2] James F. Blinn. Models of light reflection for computer synthesized pictures[J]. Siggraph ’77,California,1977,11(2):192-198

[3] [3] Xincheng Ren. Lixin Guo. Study on optical wave scattering from slightly Gaussian rough surface of layered medium[J]. Chin. Opt. Lett.,2007,5(10):605-608

[4] [4] Lei Yang,Jiuqiang Han. A polynomial hybrid reflection model and measurement of its parameters based on images of sample[J]. Chin. Opt. Lett.,2007,5(12):683-686

[5] [5] Wei Huajiang,Xing Da,Wu Guoyong et al.. Using spatially resolved reflectance to measure optical properties of stomach tissue[J]. Chinese J. Lasers,2007,34(4):582-587

[6] [6] Ye Jiaxiong,Xu Qiyang,Fu Xinyao. Detection of a sound of modulation signal in scattering laser[J]. Chinese J. Lasers,2007,34(4):507-510

[7] [7] J. D. Kristin,V. G. Bram,K. N. Shree et al.. Reflectance and texture of real-world surfaces [J]. ACM Transactions on Graphics,1999,18(1):1-34

[8] [8] F. E. Nicodemus,J. C. Richmon,J. J. Hsia et al.. Geometric Considerations and Nomenclature for Reflectance [S]. Washington:National Bureau of Standards,1977,1-67

[9] [9] M. Barilli,A. Mazzoni. An equipment for measuring 3D bi-directional scattering distribution function of black painted and differently machined surfaces [C]. SPIE,2005,5962:59620L

[10] [10] Li Hongsong,Sing Choong Foo,Kenneth E. Torrance et al.. Automated three-axis gonioreflectometer for computer graphics applications[C]. SPIE,2005,5878:58780S

[11] [11] Gu Zuhan,Wang Anting. Experimental reconstruction for inverse scattering of onedimensional surfaces[C]. SPIE,2007,6672:66720H

[12] [12] Audrey Le Lay. New measurement tool to measure scattering of materials for 2D/3D scattered light measurements & BRDF/BTDF measurements[C]. SPIE,2005,5965:596527

[13] [13] J. D. Kristin. Device for convenient measurement of spatially varying bidirectional reflectance[J]. J. Opt. Soc. Am. A,2004,21(1):1-12

[14] [14] C. Hahlweg,H. Rothe. Classification of optical surface properties and material recognition using multi-spectral BRDF data measured with a semi-hemispherical spectro-radiometer in VIS and NIR[C]. SPIE,2005,5965:59650G

[15] [15] C. Hahlweg,H. Rothe. Hemispherical radiometer for angle resolved measurement of IR scatter and radiation behaviour[C]. SPIE,2006,6396:63960F

[16] [16] J. C. Stover. Scatter from optical components:an overview[C]. SPIE,1989,1165:2-9

[17] [17] Jin Weiqi,Hu Weijie. Radiometry,Photometry and Chroma Measurement[M]. Beijing:Beijing University of Science and Technology Press,2006. 3-33