Chinese Journal of Lasers, Volume. 32, Issue 5, 685(2005)

A High-Reflectivity Al2O3/MgF2 Mirrors for 193 nm

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less

    The single-layer films of Al2O3 and MgF2 were deposited upon super polished fused-silica by electron-beam evaporation and were characterized. The subsequent optical constants n and k were reported for the spectral range of 180~230 nm. High-reflectivity (HR) Al2O3/MgF2 mirrors were designed and produced for the wavelength of 193 nm. The annealed mirrors with a reflectance of more than 96% at 193nm were obtained. It was found that the single layers of Al2O3 and MgF2 deposited according to optimized process could get suitable optical properties at 193 nm. And it was easier for HR mirrors to form the oxygen-deficient Al2O3 films than the single layers.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A High-Reflectivity Al2O3/MgF2 Mirrors for 193 nm[J]. Chinese Journal of Lasers, 2005, 32(5): 685

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: materials and thin films

    Received: May. 11, 2004

    Accepted: --

    Published Online: Jun. 1, 2006

    The Author Email: (shangshuzhen@siom.ac.cn)

    DOI:

    Topics