Journal of Infrared and Millimeter Waves, Volume. 43, Issue 5, 615(2024)

The different characteristics of dark and bright configurations of photoreflectance based on grating spectrometer

Jia ZHAN1, Fang-Xing ZHA1、*, and Yi GU2
Author Affiliations
  • 1Department of Physics,Shanghai University,Shanghai 200444,China
  • 2Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
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    Figures & Tables(3)
    Schematic diagram of experimental setup for the bright and dark configuration PR measurement. (a) Dark configuration; (b) Bright configuration
    Room temperature PR spectra measured by using dark and bright configurations for InP/InGaAs/InP heterostructure. (a) Dark configuration spectrum; (b) Bright configuration spectrum
    Room temperature PR and PL spectra measured by using dark configuration with 1 064 nm laser for InP/InGaAs/InP heterostructure. (a) 0.71-0.80 eV; (b) 1.15-1.45 eV
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    Jia ZHAN, Fang-Xing ZHA, Yi GU. The different characteristics of dark and bright configurations of photoreflectance based on grating spectrometer[J]. Journal of Infrared and Millimeter Waves, 2024, 43(5): 615

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    Paper Information

    Category: Infrared Materials and Devices

    Received: Jan. 10, 2024

    Accepted: --

    Published Online: Dec. 2, 2024

    The Author Email: Fang-Xing ZHA (fxzha@shu.edu.cn)

    DOI:10.11972/j.issn.1001-9014.2024.05.005

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