Journal of Infrared and Millimeter Waves, Volume. 43, Issue 5, 615(2024)
The different characteristics of dark and bright configurations of photoreflectance based on grating spectrometer
Fig. 1. Schematic diagram of experimental setup for the bright and dark configuration PR measurement. (a) Dark configuration; (b) Bright configuration
Fig. 2. Room temperature PR spectra measured by using dark and bright configurations for InP/InGaAs/InP heterostructure. (a) Dark configuration spectrum; (b) Bright configuration spectrum
Fig. 3. Room temperature PR and PL spectra measured by using dark configuration with 1 064 nm laser for InP/InGaAs/InP heterostructure. (a) 0.71-0.80 eV; (b) 1.15-1.45 eV
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Jia ZHAN, Fang-Xing ZHA, Yi GU. The different characteristics of dark and bright configurations of photoreflectance based on grating spectrometer[J]. Journal of Infrared and Millimeter Waves, 2024, 43(5): 615
Category: Infrared Materials and Devices
Received: Jan. 10, 2024
Accepted: --
Published Online: Dec. 2, 2024
The Author Email: Fang-Xing ZHA (fxzha@shu.edu.cn)