Acta Optica Sinica, Volume. 38, Issue 5, 0505001(2018)

Groove Profile Prediction of Grating Masks in Scanning Beam Interference Lithography

Sen Lu1,2, Kaiming Yang1、*, Yu Zhu1,2, Leijie Wang1,2, and Ming Zhang1,2
Author Affiliations
  • 1 State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing 100084, China
  • 2 Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipment and Control, Tsinghua University, Beijing 100084, China
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    Figures & Tables(8)
    Schematic of SBIL
    Schematic of light wave propagating in photoresist layer
    Normalized exposure within photoresist
    Schematic of FMM
    Profile evolution curves under influence of standing wave effect
    Reflectivity versus thickness of ARC
    Profile evolution curves after elimination of standing wave effect
    • Table 1. Simulation parameters

      View table

      Table 1. Simulation parameters

      ParameterContent
      Wavelength355 nm
      Incident angle45°
      Refractive index of air1.0
      Refractive index of photoresist1.71-0.018i
      Thickness of photoresist400 nm
      Refractive index of ARC1.82-0.34i
      Refractive index of substrate0.883-2.778i
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    Sen Lu, Kaiming Yang, Yu Zhu, Leijie Wang, Ming Zhang. Groove Profile Prediction of Grating Masks in Scanning Beam Interference Lithography[J]. Acta Optica Sinica, 2018, 38(5): 0505001

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    Paper Information

    Category: Diffraction and Gratings

    Received: Sep. 27, 2017

    Accepted: --

    Published Online: Jul. 10, 2018

    The Author Email: Yang Kaiming ( yangkm@tsinghua.edu.cn)

    DOI:10.3788/AOS201838.0505001

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