Chinese Optics Letters, Volume. 2, Issue 9, 09520(2004)

Position sensor based on slit imaging

Aijun Zeng, Xiangzhao Wang, Yang Bu, and Dailin Li
Author Affiliations
  • Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
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    References(6)

    [1] [1] X. D. Liu and Y. Z. Gu, Proc. SPIE 3897, 214 (1999).

    [2] [2] R. G. Dorsch, G. Hausler, and J. M. Herrmann, Appl. Opt. 33, 1306 (1994).

    [3] [3] X. F. Zhang, B. G. Wang, and C. Z. Jiang, Opt. Technique (in Chinese) 27, 362 (2001).

    [4] [4] Z. H. Huang, H. Y. Cai, H. Q. Li, and Y. M. Zhang, Opto-Electron. Eng. (in Chinese) 29, 58 (2002).

    CLP Journals

    [1] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Coaxiality Method for Position and Angle Deviation Measurement[J]. Acta Photonica Sinica, 2007, 36(11): 2098

    [2] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Coaxiality measurement method based on revising aberration[J]. Optics and Precision Engineering, 2007, 15(11): 1712

    [3] Jianming Hu, Aijun Zeng, Xiangzhao Wang, "A position sensor based on grating projection with spatial filtering and polarization modulation," Chin. Opt. Lett. 4, 0118 (2006)

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: May. 11, 2004

    Accepted: --

    Published Online: Jun. 6, 2006

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