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Chinese Optics Letters, Volume. 21, Issue 4, 041203(2023)

Dark-field line confocal imaging with point confocality and extended line field for bulk defects detection Editors' Pick

Jingtao Dong1、*, Tengda Zhang1, Lei Yang1, Yuzhong Zhang1, Rongsheng Lu1、**, and Xinglong Xie2、***
Author Affiliations
  • 1Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-electronic Engineering, Hefei University of Technology, Hefei 230009, China
  • 2Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    Jingtao Dong, Tengda Zhang, Lei Yang, Yuzhong Zhang, Rongsheng Lu, Xinglong Xie, "Dark-field line confocal imaging with point confocality and extended line field for bulk defects detection," Chin. Opt. Lett. 21, 041203 (2023)

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    Paper Information

    Category: Instrumentation, Measurement, and Optical Sensing

    Received: Oct. 19, 2022

    Accepted: Dec. 6, 2022

    Posted: Dec. 6, 2022

    Published Online: Mar. 15, 2023

    The Author Email: Jingtao Dong (jtdong@hfut.edu.cn), Rongsheng Lu (rslu@hfut.edu.cn), Xinglong Xie (xiexl329@mail.shcnc.ac.cn)

    DOI:10.3788/COL202321.041203

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology