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Microelectronics, Volume. 55, Issue 1, 59(2025)

Experimental Study on Total Ionizing Dose Effect of Microprocessors with Different Feature Sizes

FAN Heng1, LIANG Runcheng2, CHEN Faguo2, GUO Rong2, and ZHENG Zhirui2
Author Affiliations
  • 1Nuclear Power Institute of China, Chengdu 610041, P. R. China
  • 2China Institute for Radiation Protection, Taiyuan 030006, P. R. China
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    FAN Heng, LIANG Runcheng, CHEN Faguo, GUO Rong, ZHENG Zhirui. Experimental Study on Total Ionizing Dose Effect of Microprocessors with Different Feature Sizes[J]. Microelectronics, 2025, 55(1): 59

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    Paper Information

    Special Issue:

    Received: Mar. 25, 2024

    Accepted: Jun. 19, 2025

    Published Online: Jun. 19, 2025

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.240072

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology