Chinese Journal of Lasers, Volume. 38, Issue 1, 102002(2011)
Beam Quality of High Power Vertical-Cavity Bottom-Emitting Semiconductor Lasers
Research on the beam quality of high-power bottom-emitting laser-diode from the M2 factor, the far field divergence angle, near field and far-field intensity distribution is done. Analysis of different device parameters on the beam quality is also made. Vertical cavity surface emitting laser (VCSEL) array with a novel arrangement is designed. By the modulation of the aperture size and the centre spacing of the units, high power density up to 1 kW/cm2 and good beam property of Gaussian far-field distribution at 4 A injecting current are obtained. Compared with the single device and the 4×4 two-dimensional array with the same total lasing area, the novel array is better in the property of lasing spectra and far-field distribution, etc.
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Cui Jinjiang, Ning Yongqiang, Jiang Chenyu, Wang Fan, Gao Jing, Zhang Xing, Wang Zhenfu, Wu Xiaodong, Tan Huiming. Beam Quality of High Power Vertical-Cavity Bottom-Emitting Semiconductor Lasers[J]. Chinese Journal of Lasers, 2011, 38(1): 102002
Category: Laser physics
Received: Mar. 18, 2010
Accepted: --
Published Online: Dec. 24, 2010
The Author Email: Jinjiang Cui (cuijjciomp@yahoo.com.cn)