Chinese Journal of Lasers, Volume. 38, Issue 1, 102002(2011)

Beam Quality of High Power Vertical-Cavity Bottom-Emitting Semiconductor Lasers

Cui Jinjiang1、*, Ning Yongqiang2, Jiang Chenyu1, Wang Fan1, Gao Jing1, Zhang Xing2, Wang Zhenfu2, Wu Xiaodong1, and Tan Huiming1
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  • 2[in Chinese]
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    Research on the beam quality of high-power bottom-emitting laser-diode from the M2 factor, the far field divergence angle, near field and far-field intensity distribution is done. Analysis of different device parameters on the beam quality is also made. Vertical cavity surface emitting laser (VCSEL) array with a novel arrangement is designed. By the modulation of the aperture size and the centre spacing of the units, high power density up to 1 kW/cm2 and good beam property of Gaussian far-field distribution at 4 A injecting current are obtained. Compared with the single device and the 4×4 two-dimensional array with the same total lasing area, the novel array is better in the property of lasing spectra and far-field distribution, etc.

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    Cui Jinjiang, Ning Yongqiang, Jiang Chenyu, Wang Fan, Gao Jing, Zhang Xing, Wang Zhenfu, Wu Xiaodong, Tan Huiming. Beam Quality of High Power Vertical-Cavity Bottom-Emitting Semiconductor Lasers[J]. Chinese Journal of Lasers, 2011, 38(1): 102002

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    Paper Information

    Category: Laser physics

    Received: Mar. 18, 2010

    Accepted: --

    Published Online: Dec. 24, 2010

    The Author Email: Jinjiang Cui (cuijjciomp@yahoo.com.cn)

    DOI:10.3788/cjl201138.0102002

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