Acta Optica Sinica, Volume. 39, Issue 2, 0231001(2019)

Encapsulation Structure of Gradient Refractive Index with Ultralow Reflectance

Guojun Jin**, Kai Xu, Jun Tan, Lingli Wang, and Yanlong Meng*
Author Affiliations
  • College of Optical and Electronic Technology, China Jiliang University, Hangzhou, Zhejiang 310018, China
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    Figures & Tables(7)
    System structure of inductively coupled plasma enhanced chemical vapor deposition
    AFM images of different samples. (a) D1; (b) D2; (c) D3; (d) D4
    Refractive index of SiO2 thin film
    Structure of perovskite cell encapsulated by SiO2 multi-films with gradient refractive index
    Reflectance of perovskite cells with different encapsulation structures
    Transmittance of perovskite cells with different encapsulation structures
    • Table 1. Preparation conditions of SiO2 thin film in different groups

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      Table 1. Preparation conditions of SiO2 thin film in different groups

      SamplesUp-RF power /WDown-RF power /WPressure /Pa
      D15007054.989
      D250010055.021
      D350015054.949
      D450020055.021
      D550025055.119
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    Guojun Jin, Kai Xu, Jun Tan, Lingli Wang, Yanlong Meng. Encapsulation Structure of Gradient Refractive Index with Ultralow Reflectance[J]. Acta Optica Sinica, 2019, 39(2): 0231001

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    Paper Information

    Category: Thin Films

    Received: Jul. 20, 2018

    Accepted: Sep. 17, 2018

    Published Online: May. 10, 2019

    The Author Email:

    DOI:10.3788/AOS201939.0231001

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