Laser & Optoelectronics Progress, Volume. 59, Issue 17, 1734001(2022)

Effect of X-Ray Energy on X-Ray CsI(Tl) Scintillation Screen Based on Macroporous Silicon

Shuangshuang Wang, Chunyang Liu*, Guozheng Wang, and Xulei Qin
Author Affiliations
  • College of Physics, Changchun University of Science and Technolog , Changchun 130022, Jilin , China
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    References(19)

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    [17] Zheng S C. Experiment on Compton scatter imaging method[J]. Nondestructive Testing, 17, 301-304(1995).

    [18] Chen J P, Yang J X, Zou J et al. Optimization of CsI(Tl) scintillator thickness based on Geant4 simulation[J]. Nanotechnology and Precision Engineering, 15, 444-448(2017).

    [19] Zhang Y A, Miao J C, Wu Z F. Experimental study on the relationship between X-ray thickness tube voltage and thickness measurement range[C](2015).

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    Shuangshuang Wang, Chunyang Liu, Guozheng Wang, Xulei Qin. Effect of X-Ray Energy on X-Ray CsI(Tl) Scintillation Screen Based on Macroporous Silicon[J]. Laser & Optoelectronics Progress, 2022, 59(17): 1734001

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    Paper Information

    Category: X-Ray Optics

    Received: Oct. 8, 2021

    Accepted: Dec. 21, 2021

    Published Online: Aug. 22, 2022

    The Author Email: Chunyang Liu (liucy169@nenu.edu.cn)

    DOI:10.3788/LOP202259.1734001

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