Acta Optica Sinica, Volume. 40, Issue 14, 1410001(2020)

Center Extraction Method of Multiple and Overlapping Faculae Based on Ellipse Fitting

Deng Pan1,2, Yanli Li1, Dong Gao1,2、*, and Jianhua Zheng1,2
Author Affiliations
  • 1National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China
  • 2University of Chinese Academy of Sciences, Beijing 101407, China
  • show less
    Figures & Tables(12)
    Flow chart of multiple facula/overlapping facula center extraction algorithm
    Input image
    Binary graph after preprocessing
    Connected domain diagram
    Image after edge extraction
    Shape factor varying with oblateness and degree of overlap. (a) Shape factor varying with oblateness; (b) shape factor varying with degree of overlap
    Overlapping facula segmentation
    Spot center extraction results
    Real solar faculae. (a) Image of real solar faculae; (b) cross section of gray value distribution of single solar facula
    Local images obtained by some experiments. (a) Circle faculae obtained by experiment on degree of overlap; (b) ellipse faculae obtained by experiment on degree of overlap; (c) ellipse faculae obtained by experiment on overlapping angle
    • Table 1. Average position errors

      View table

      Table 1. Average position errors

      Facula typeθe /(°)Average position error /pixel
      No overlap0<Roverlap≤0.250.25<Roverlap≤0.5
      Circular facula0.01890.11850.1849
      Oval facula (Roblateness=0.25)00.03080.11360.1979
      300.26810.2709
      600.23830.3642
      900.20350.2256
      Oval facula (Roblateness=0.5)00.00910.15540.2350
      300.27390.4522
      600.19700.3399
      900.22630.3407
    • Table 2. Average standard deviationpixel

      View table

      Table 2. Average standard deviationpixel

      ConditionAbscissaOrdinate
      No overlap0.054450.07520
      0<Roverlap≤0.250.169250.43895
      0.25<Roverlap≤0.50.327600.43820
    Tools

    Get Citation

    Copy Citation Text

    Deng Pan, Yanli Li, Dong Gao, Jianhua Zheng. Center Extraction Method of Multiple and Overlapping Faculae Based on Ellipse Fitting[J]. Acta Optica Sinica, 2020, 40(14): 1410001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Image Processing

    Received: Mar. 26, 2020

    Accepted: Apr. 28, 2020

    Published Online: Jul. 23, 2020

    The Author Email: Gao Dong (gaodong@nssc.ac.cn)

    DOI:10.3788/AOS202040.1410001

    Topics