Acta Optica Sinica, Volume. 42, Issue 2, 0212001(2022)

Photoacoustic Detection Method for Depth of Surface Narrow Defects

Haiyang Li1, Binliang Zhi1, Qianghua Pan2, Zhiwu An3, and Ruien Yu1、*
Author Affiliations
  • 1Shanxi Provincial Key Laboratory of Advanced Manufacturing Technology, North University of China, Taiyuan, Shanxi 0 30051, China
  • 2China Special Equipment Inspection & Research Institute, Beijing 100029, China;
  • 3Institute of Acoustics, Chinese Academy of Sciences, Beijing 100190, China
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    Figures & Tables(15)
    Waveform conversion phenomenon at tip of surface defect
    Ultrasonic field of surface defect at different moments. (a) 3.77 μs; (b) 3.95 μs; (c) 4.26 μs; (d) 4.51 μs
    Simulation waveforms of narrow defect
    Simulation waveforms of extremely narrow defects
    Simulation waveforms of wide defects
    Experimental platform of laser ultrasound and sample
    Experimental detection waveforms
    Depth measurement results of narrow defects
    Depth measurement results of narrow defect and extremely narrow defect
    • Table 1. Simulation data of narrow defects

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      Table 1. Simulation data of narrow defects

      Defect size /(mm×mm)0.2×0.10.2×0.20.3×0.20.4×0.20.5×0.2
      tRR /μs4.714.714.714.714.71
      tRS /μs4.915.015.085.125.18
      Δt /μs0.200.300.370.410.47
      Measuring depth /mm0.18650.17980.31500.39240.5083
      Error /mm-0.0135-0.02020.0150-0.00760.0083
      Error rate /%6.7410.125.021.911.66
    • Table 2. Simulation data of extremely narrow defects

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      Table 2. Simulation data of extremely narrow defects

      Defect size /(mm×mm)1×0.052×0.13×0.14×0.15×0.1
      tRR /μs4.714.714.714.714.71
      tRS /μs5.275.746.286.867.45
      Δt /μs0.561.031.572.152.74
      Measuring depth 1 /mm1.08221.99053.03414.15505.2952
      Error 1 /mm0.0822-0.00950.03410.15500.2952
      Error rate 1 /%8.220.471.143.885.90
      Measuring depth 2 /mm0.98221.79052.83413.95505.0952
      Error 2 /mm-0.0178-0.2095-0.1659-0.04500.0952
      Error rate 2 /%1.7810.475.531.121.90
    • Table 3. Simulation data of wide defects

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      Table 3. Simulation data of wide defects

      Defect size /(mm×mm)0.1×0.20.1×0.250.2×0.250.2×0.30.2×0.5
      tRR /μs4.714.714.714.714.71
      tRS /μs4.924.955.015.065.19
      Δt /μs0.210.240.300.350.48
      Measuring depth /mm0.0058-0.03620.07980.0764-0.0724
      Error δ /mm-0.0942-0.1362-0.1202-0.1236-0.2724
      Error rate /%94.16136.1960.1261.80136.19
    • Table 4. Experimental data of surface defects

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      Table 4. Experimental data of surface defects

      d /mm0.10.20.30.40.5
      tRR /μs20.5220.5220.5220.5220.52
      tRS /μs20.7320.8220.8820.9421
      Δt /μs0.210.30.360.420.48
      Measuring depth /mm0.00580.17980.29570.41170.5276
      Error δ /mm-0.0942-0.0202-0.00430.01170.0276
      Error rate /%94.1610.121.432.925.53
    • Table 5. Cooper’s experimental data analysis

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      Table 5. Cooper’s experimental data analysis

      d /mm0.10.150.20.250.50.751
      tRR /μs4.714.714.714.714.714.714.71
      tRS /μs4.864.884.94.935.085.235.32
      Δt /μs0.150.170.190.220.370.520.61
      Measuring depth 1 /mm0.28990.32850.36720.42520.71501.00491.1789
      Error 1 /mm0.18990.17850.16720.17520.21500.25490.1789
      Error rate 1 /%189.88119.0283.5970.0743.0133.9917.89
      Measuring depth 2 /mm0.08990.12850.16720.22520.51500.80490.9789
      Error 2 /mm-0.0101-0.0215-0.0328-0.02480.01500.0549-0.0211
      Error rate 2 /%10.1214.3116.419.933.017.322.11
    • Table 6. Data analysis for Jeong’s experiment

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      Table 6. Data analysis for Jeong’s experiment

      d /mm0.312345
      tRR /μs4.714.714.714.714.714.71
      tRS /μs4.965.325.846.326.877.45
      Δt /μs0.250.611.131.612.162.74
      Measuring depth 1 /mm0.48311.17892.18383.11144.17435.2952
      Error 1 /mm0.18310.17890.18380.11140.17430.2952
      Error rate 1 /%61.0517.899.193.714.365.90
      Measuring depth 2 /mm0.28310.97891.98382.91143.97435.0952
      Error 2 /mm-0.0169-0.0211-0.0162-0.0886-0.02570.0952
      Error rate 2 /%5.622.110.812.950.641.90
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    Haiyang Li, Binliang Zhi, Qianghua Pan, Zhiwu An, Ruien Yu. Photoacoustic Detection Method for Depth of Surface Narrow Defects[J]. Acta Optica Sinica, 2022, 42(2): 0212001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: May. 28, 2021

    Accepted: Jul. 19, 2021

    Published Online: Dec. 29, 2021

    The Author Email: Yu Ruien (yuruien@nuc.edu.cn)

    DOI:10.3788/AOS202242.0212001

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