Laser & Optoelectronics Progress, Volume. 62, Issue 8, 0811006(2025)

Wider Field of View Imaging Method in Super-Resolution Microscopy Based on Square Aperture

Bowen Liu1、*, Junkang Dai1, Zhen'an Fu1, Zitong Jin1, Minghui Duan1,2, Huaian Chen1, and Yi Jin1
Author Affiliations
  • 1Department of Precision Machinery and Precision Instruments, School of Engineering Science, University of Science and Technology of China, Hefei 230022, Anhui , China
  • 2School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui , China
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    References(29)

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    [22] Wang W S. Research on methods and techniques of imaging signal-to-noise ratio and contrast enhancement in STED super-resolution microscopy[D](2021).

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    Bowen Liu, Junkang Dai, Zhen'an Fu, Zitong Jin, Minghui Duan, Huaian Chen, Yi Jin. Wider Field of View Imaging Method in Super-Resolution Microscopy Based on Square Aperture[J]. Laser & Optoelectronics Progress, 2025, 62(8): 0811006

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    Paper Information

    Category: Imaging Systems

    Received: Aug. 20, 2024

    Accepted: Oct. 11, 2024

    Published Online: Mar. 24, 2025

    The Author Email:

    DOI:10.3788/LOP241881

    CSTR:32186.14.LOP241881

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