Acta Optica Sinica, Volume. 15, Issue 2, 230(1995)
Analysis of Antireflective and Simultaneouslly Antireflective a-C:H Films in Both Single-Double Band by Ellipsometry Method
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of Antireflective and Simultaneouslly Antireflective a-C:H Films in Both Single-Double Band by Ellipsometry Method[J]. Acta Optica Sinica, 1995, 15(2): 230
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