Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Acta Optica Sinica, Volume. 38, Issue 11, 1112005(2018)

Highlight Removal of High Reflectivity Workpiece and Vision Measurement Based on Polarization Information

Zhenmin Zhu1、*, Shuang Pei1、*, Shiming Chen1, and Fumin Zhang2
Author Affiliations
  • 1 School of Electrical and Automation Engineering, East China Jiaotong University, Nanchang, Jiangxi 330013, China
  • 2 State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin University, Tianjin 300072, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (16)
    Equations (0)
    References (0)
    Cited By (4)
    Tools
    Paper Information
    Topics
    Cited By

    Article index updated: Mar. 10, 2025

    The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)
    Tools

    Get Citation

    Copy Citation Text

    Zhenmin Zhu, Shuang Pei, Shiming Chen, Fumin Zhang. Highlight Removal of High Reflectivity Workpiece and Vision Measurement Based on Polarization Information[J]. Acta Optica Sinica, 2018, 38(11): 1112005

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: May. 7, 2018

    Accepted: Jun. 19, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/AOS201838.1112005

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology