Spectroscopy and Spectral Analysis, Volume. 41, Issue 1, 105(2021)
The Application of Kamers-Kronig Relation in Time Domain Spectral Measurement of Reflection Terahertz
Fig. 3. Phase results recovered by Kamers-Kronig relation and MEM method
Fig. 4. Inversion result of silicon wafer’s material parameters
(a): The refractive index; (b): Extinction coefficient; (c): Real part of permittivity; (d): Imaginary part of permittivity
Fig. 6. Comparison of refractive index and extinction coefficient of silicon by transmission and reflection measurement
(a): The refractive index; (b): Extinction coefficient
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He CAI, Jing ZHANG, Yan ZHENG, Jin-hai SUN, Xu-tao ZHANG, Liang-sheng LI, Yong-qiang LIU, Hong-cheng YIN. The Application of Kamers-Kronig Relation in Time Domain Spectral Measurement of Reflection Terahertz[J]. Spectroscopy and Spectral Analysis, 2021, 41(1): 105
Category: Research Articles
Received: Dec. 2, 2019
Accepted: --
Published Online: Apr. 8, 2021
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