Opto-Electronic Engineering, Volume. 35, Issue 9, 41(2008)

Design of Cavity Facet Reflectivity for 808 nm Semiconductor Lasers

DU Wei-hua1,2、*, YANG Hong-wei2, CHEN Guo-ying1, CHEN Hong-tai2, LI Ya-jing1,2, and PENG Hai-tao1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less

    Material internal parameters, such as internal quantum efficiency, internal loss, transparent current density mode gain and so on, were obtained by P-I test for different cavity length 808nm semiconductor laser diodes. The relation between cavity facet reflectivity and power conversion efficiency was analyzed, and the relation curves were acquired by the design of cavity facet reflectivity according to these internal parameters. Then, we did cavity facet coating experiments. Experimental results are well consisted with the theoretical prediction through comparison. The maximal power conversion efficiency can be achieved through the design of cavity facet reflectivity, and the semiconductor laser diodes can work in an optimal condition.

    Tools

    Get Citation

    Copy Citation Text

    DU Wei-hua, YANG Hong-wei, CHEN Guo-ying, CHEN Hong-tai, LI Ya-jing, PENG Hai-tao. Design of Cavity Facet Reflectivity for 808 nm Semiconductor Lasers[J]. Opto-Electronic Engineering, 2008, 35(9): 41

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Feb. 29, 2008

    Accepted: --

    Published Online: Mar. 1, 2010

    The Author Email: Wei-hua DU (dwhuk@126.com)

    DOI:

    CSTR:32186.14.

    Topics