Acta Optica Sinica, Volume. 34, Issue 5, 512001(2014)
Sub-Micron Precision Measurement of Radius of Curvature and Uncertainties Analysis
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Peng Shijun, Miao Erlong. Sub-Micron Precision Measurement of Radius of Curvature and Uncertainties Analysis[J]. Acta Optica Sinica, 2014, 34(5): 512001
Category: Instrumentation, Measurement and Metrology
Received: Sep. 25, 2013
Accepted: --
Published Online: Apr. 18, 2014
The Author Email: Shijun Peng (shijun_peng@qq.com)