Chinese Optics Letters, Volume. 15, Issue 3, 032301(2017)

Multimode-interference-based crossing for metal-insulator-metal waveguides

Weijie Mai1,2, Luna Cui1,2、*, and Li Yu1,2
Author Affiliations
  • 1State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing 100876, China
  • 2School of Science, Beijing University of Posts and Telecommunications, Beijing 100876, China
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    Figures & Tables(5)
    (a) Dispersion relation of MIM waveguide. (b) The field profile (Hy) of the first four TM modes in a 700 nm wide waveguide.
    Schematic of the MMI-based crossing.
    Calculated throughput and crosstalk for MMI-based crossing as function of the MMI length Lm. Here, ws=100 nm and Wm=560 nm.
    Field distribution (Hy) at λ=1550 nm for (a) MIM-based crossing and (b) direct crossing. (c) Throughput (solid lines) and crosstalk (dashed lines) for MIM-based crossing (blue lines) and direct crossing (red lines).
    Fabrication tolerance of the proposed MMI-based crossing when there is an MMI waveguide width variation ΔWm.
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    Weijie Mai, Luna Cui, Li Yu, "Multimode-interference-based crossing for metal-insulator-metal waveguides," Chin. Opt. Lett. 15, 032301 (2017)

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    Paper Information

    Category: Optical devices

    Received: Sep. 24, 2016

    Accepted: Dec. 23, 2016

    Published Online: Jul. 25, 2018

    The Author Email: Luna Cui (luna0517@126.com)

    DOI:10.3788/COL201715.032301

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