Temporal characteristic simulation for stimulated emission depletion microscopy

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Chinese Optics Letters, Volume. 3, Issue 0s, 318(2005)

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

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References(8)

[1] [1] E. Abbe, Gesammelte Abhabdlungen (G. Fischer, Jena, 1904).

[2] [2] Westphal, V. L. Kastrup, and S. W. Hell, Appl. Phys. B 77, 377 (2003).

[3] [3] M. Dyba and S. W. Hell, Phys. Rev. Lett. 88, 163901 (2003).

[4] [4] T. A. Klar, E. Engel, and S. W. Hell, Phys. Rev. E 64, 066613 (2001).

[5] [5] S. W. Hell and J. Wichmann, Opt. Lett. 19, 780 (1994).

[6] [6] T. A. Klar, S. Jakobs, M. Dyba, and S. W. Hell, PNAS, 97, 8206 (2000).

[7] [7] M. Dyba and S. W. Hell, Appl. Opt. 42, 5123 (2003).

[8] [8] G. E. Cragg and P. T. C. So, Opt. Lett. 25, 46 (2000).

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], "Temporal characteristic simulation for stimulated emission depletion microscopy," Chin. Opt. Lett. 3, 318 (2005)

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Paper Information

Received: --

Accepted: --

Published Online: Mar. 5, 2007

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Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology