Acta Physica Sinica, Volume. 68, Issue 24, 247303-1(2019)
[16] Wu D F, Yang B D[J]. Principle, Test and Process of Ohmic Contact at Metal-semiconductor Interface, 36-39(1989).
Get Citation
Copy Citation Text
Wei-Ling Guo, Jie Deng, Jia-Lu Wang, Le Wang, Jian-Peng Tai.
Received: Jun. 26, 2019
Accepted: --
Published Online: Sep. 17, 2020
The Author Email: