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Spectroscopy and Spectral Analysis, Volume. 35, Issue 7, 2034(2015)

The Study of Advanced Fundamental Parameter Method in EDXRFA

CHENG Feng*, ZHANG Qing-xian, GE Liang-quan, GU Yi, ZENG Guo-qiang, LUO Yao-yao, CHEN Shuang, WANG Lei, and ZHAO Jian-kun
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    CHENG Feng, ZHANG Qing-xian, GE Liang-quan, GU Yi, ZENG Guo-qiang, LUO Yao-yao, CHEN Shuang, WANG Lei, ZHAO Jian-kun. The Study of Advanced Fundamental Parameter Method in EDXRFA[J]. Spectroscopy and Spectral Analysis, 2015, 35(7): 2034

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    Paper Information

    Received: Dec. 29, 2014

    Accepted: --

    Published Online: Sep. 8, 2015

    The Author Email: Feng CHENG (chengfeng@cdut.cn)

    DOI:10.3964/j.issn.1000-0593(2015)07-2034-04

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology