Laser & Optoelectronics Progress, Volume. 61, Issue 1, 0112003(2024)

Ultrafast Microwave Photonics Frequency Measurement Technology (Invited)

Henan Wang1、*, Liang Chen1, Yongguang Qi1, Dexin Ba2,3, and Yongkang Dong2,3、**
Author Affiliations
  • 1Beijing Institute of Control and Electronic Technology, Beijing 102300, China
  • 2State Key Laboratory of Tunable Laser Technology, Harbin Institute of Technology, Harbin 150001, Heilongjiang, China
  • 3Zhengzhou Research Institute, Harbin Institute of Technology, Zhengzhou 450000, Henan, China
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    Figures & Tables(23)
    Principle of microwave photonics frequency measurement technology
    Photonics microwave spectrum analysis based on tunable FP filter[1]
    Photonics microwave spectrum analysis based on SBS effect[5]
    Photonics microwave spectrum analysis based on on-chip Brillouin filter[11]
    Photonics microwave frequency measurement based on microwave power-frequency mapping[13]. (a) Experimental setup;(b) power fading curve and ACF
    Microwave photonics frequency measurement based on optical mixing unit implemented two cascaded MZMs[30]
    Microwave photonics frequency measurement based on optical mixing unit implemented highly nonlinear fiber[32]
    Photonics microwave frequency measurement based on optical power-frequency mapping implementing by dual-sources and single filter[37]. (a) Experimental setup;(b) filter responses and ACF
    Photonics microwave frequency measurement based on optical power-frequency mapping implementing by single source and complementary filters pair[38]. (a) Experimental setup; (b) transmission responses of the complementary filter pair
    Photonics microwave frequency measurement based on optical power-frequency mapping implementing by single source and FBG filter[41]. (a) Experimental setup;(b) reflection and transmission output power and ACF
    Wide spectrum dynamic microwave frequency recognition based on silicon Bragg grating[43]
    Space division multiplexing microwave channelization based on free space diffraction grating[48]
    Frequency division multiplexing microwave channelization based on spectrum slicing incoherent source[49]
    Frequency division multiplexing microwave channelization based on SBS effect[54]. (a) Experimental setup;(b) frequency division multiplexing channelization
    Time division multiplexing microwave channelization based on optical wavelength scanning source[55]. (a) Experimental setup; (b) time division multiplexing channelization
    Time division multiplexing microwave channelization based on SBS and frequency shifting cyclic delay line[57]. (a) Experimental setup; (b) time division multiplexing channelization
    Principle of ultrafast microwave photonics frequency measurement based on OCC transient SBS
    Experimental setup of ultrafast microwave photonics frequency measurement scheme based on OCC transient SBS
    Ultrafast frequency measurement results of microwave with single component. (a) Triangular frequency modulated microwave; (b) demodulation results of triangular microwave; (c) Costas code frequency modulated microwave; (d) demodulation results of Costas code frequency modulated microwave
    Ultrafast frequency measurement results of microwave with multiple components. (a) Triangular-single frequency modulated microwave; (b) demodulation results of triangular-single microwave; (c) double triangular frequency modulated microwave; (d) demodulation results of double triangular frequency modulated microwave
    Flow chart of demodulation algorithm based on image processing and artificial neural network
    Signals to be demodulated and demodulation results. (a) The measured transient spectrum to be demodulated; (b) demodulation results of two demodulation algorithms
    Reconfigurable instantaneous bandwidth and frequency range. (a)‒(d) Measurement range of 0.15‒1.85 GHz, 6.95‒9.3 GHz, 12‒15.4 GHz, 18.15‒19.85 GHz
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    Henan Wang, Liang Chen, Yongguang Qi, Dexin Ba, Yongkang Dong. Ultrafast Microwave Photonics Frequency Measurement Technology (Invited)[J]. Laser & Optoelectronics Progress, 2024, 61(1): 0112003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 8, 2023

    Accepted: Dec. 27, 2023

    Published Online: Feb. 6, 2024

    The Author Email: Henan Wang (wanghenan1994@126.com), Yongkang Dong (aldendong@163.com)

    DOI:10.3788/LOP232641

    CSTR:32186.14.LOP232641

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