Journal of Optoelectronics · Laser, Volume. 36, Issue 1, 53(2025)

Aluminum profile defect detection based on attention and adaptive weighted feature pyramid

ZHAO Wei1 and LIU Guohua1,2、*
Author Affiliations
  • 1School of Mechanical Engineering, Tiangong University, Tianjin 300387, China
  • 2Tianjin Key Laboratory of Advanced Mechatronics Equipment Technology, Tianjin 300387, China
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    ZHAO Wei, LIU Guohua. Aluminum profile defect detection based on attention and adaptive weighted feature pyramid[J]. Journal of Optoelectronics · Laser, 2025, 36(1): 53

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    Paper Information

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    Received: Jun. 8, 2023

    Accepted: Jan. 23, 2025

    Published Online: Jan. 23, 2025

    The Author Email: LIU Guohua (liuguohua@tiangong.edu.cn)

    DOI:10.16136/j.joel.2025.01.0293

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