Journal of Optoelectronics · Laser, Volume. 36, Issue 1, 53(2025)

Aluminum profile defect detection based on attention and adaptive weighted feature pyramid

ZHAO Wei1 and LIU Guohua1,2、*
Author Affiliations
  • 1School of Mechanical Engineering, Tiangong University, Tianjin 300387, China
  • 2Tianjin Key Laboratory of Advanced Mechatronics Equipment Technology, Tianjin 300387, China
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    This paper proposes a new method for defect detection of aluminum profiles to solve the problems of existing methods in accuracy and small target defect detection. Firstly, the coordinate attention mechanism (CA) is introduced into the feature extraction network to prevent information loss, thereby avoiding missed defect detection. Secondly, the adaptive weighted feature pyramid (AWFPN) is introduced to optimize the receptive field of feature maps and attention fusion, thereby improving the efficiency of defect feature capture and utilization. At the same time, the bounding box regression loss function is improved to better handle the scale change and positioning error of defects, thereby improving the detection accuracy and speeding up the convergence speed of the model. Experimental results show that the method has significantly improved the detection effect, especially in the recognition ability of defects such as dirty points and scratches.

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    ZHAO Wei, LIU Guohua. Aluminum profile defect detection based on attention and adaptive weighted feature pyramid[J]. Journal of Optoelectronics · Laser, 2025, 36(1): 53

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    Paper Information

    Category:

    Received: Jun. 8, 2023

    Accepted: Jan. 23, 2025

    Published Online: Jan. 23, 2025

    The Author Email: LIU Guohua (liuguohua@tiangong.edu.cn)

    DOI:10.16136/j.joel.2025.01.0293

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