[1] [1] H A Macleod. Thin-Film Optical Filters [M]. London: CRC Press, 2001.

[2] [2] Qin Yuan, Li Yi, Fang Baoying, et al.. Fabrication and optical properties of vanadium dioxide thin films doped by tungsten-vanadium co-sputtering [J]. Acta Optica Sinica, 2013, 33(12): 1231002.

[3] [3] Dong Maojin, Wang Duoshu, Xiong Yuqing, et al.. Optics characterization of multi-spectrum HfON thin film [J]. Acta Optica Sinica, 2013, 33(s2): s231002.

[4] [4] D Arndt, R M Azzam, J M Bennett, et al.. Multiple determination of the optical constants of thin-film coating materials [J]. Appl Opt, 1984, 23(20): 3571-3596.

[5] [5] J Dobrowolski, F Ho, A Waldorf. Determination of optical constants of thin film coating materials based on inverse synthesis [J]. Appl Opt, 1983, 22(20): 3191-3200.

[6] [6] Wang Hongchang, Wang Zhanshan, Qin Shuji, et al.. Analysis of the reflectivity of Mo/Si multilayer film for soft X-ray [J]. Acta Optica Sinica, 2003, 23(11): 1362-1365.

[7] [7] Shen Weidong, Liu Xu, Ye Hui, et al.. A new method for determination of the optical constants and thickness of thin film [J]. Acta Optica Sinica, 2004, 24(7): 885-889.

[8] [8] Liu Chuanbiao, Wei Aixiang, Liu Yi. Optical constant and dielectric properties of erbium oxide thin films [J]. Acta Optica Sinica, 2009, 29(6): 1724-1728.

[9] [9] Fan Ping, Shao Jianda, Yi Kui, et al.. Optical constants of ion beam sputtering deposited copper films of different thickness [J]. Acta Optica Sinica, 2006, 26(6): 943-947.

[10] [10] Liu Huasong, Wang Lishuan, Jiang Chenghui, et al.. Dispersive properties of optical constants of SiO2 films in the visible and infrared regions [J]. Acta Optica Sinica, 2013, 33(10): 1031002.

[11] [11] Van Nijnatten P. Optical analysis of coatings by variable angle spectrophotometry [J]. Thin Solid Films, 2008, 516(14): 4553-4557.

[12] [12] Van Nijnatten P. An automated directional reflectance/transmittance analyser for coating analysis [J]. Thin Solid Films, 2003, 442(1): 74-79.

[13] [13] M G Hutchins, P Ageorges. Angular-dependent spectral optical properties of architectural glazings: results of an interlaboratory comparison of measurements [C]. SPIE, 1993, 2017: 13-24.

[14] [14] Y Liu, J Zhang, X Cheng, et al.. Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence [J]. Appl Opt, 2013, 52(2): 226-230.

[15] [15] M Hutchins, A Topping, C Anderson, et al.. Measurement and prediction of angle-dependent optical properties of coated glass products: results of an inter-laboratory comparison of spectral transmittance and reflectance [J]. Thin Solid Films, 2001, 392(2): 269-275.

[16] [16] W R Hunter, D Eaton, C Sah. The effects of polarizer ellipticity on ellipsometry measurements [J]. Surface Sci, 1970, 20(2): 355-376.

[17] [17] M Yamamoto, Y Takubo, S Murayama. Detection limit of resonant magnetooptic spectroscopy [J]. Jpn J Appl Phys, 1984, 23(6): 783.

[18] [18] P A Van Nijnatten. A spectrophotometer accessory for directional reflectance and transmittance of coated glazing [J]. Solar Energy, 2002, 73(3): 137-149.