Spectroscopy and Spectral Analysis, Volume. 30, Issue 8, 2184(2010)
Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals
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LI Rui-hong, HAN Yue-ping, ZHOU Han-chang, HAN Yan. Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals[J]. Spectroscopy and Spectral Analysis, 2010, 30(8): 2184
Paper Information
Received: Sep. 9, 2009
Accepted: --
Published Online: Jan. 26, 2011
The Author Email: LI Rui-hong (li1sir@126.com)
CSTR:32186.14.
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