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Laser & Optoelectronics Progress, Volume. 56, Issue 20, 202417(2019)

Design of Arch-Type Resonance Cavity Filter Based on Surface Plasmon Polaritons

Meng Wu1, Xiyin Liang1、*, Changlin Yan2, and Yunping Qi1
Author Affiliations
  • 1College of Physics Electronic Engineering, Northwest Normal University, Lanzhou, Gansu 730070, China
  • 2Huayu Branch, Lanzhou Vacuum Equipment CO, Ltd., Lanzhou, Gansu 730010, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (9)
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    References (30)
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    Figures & Tables(9)
    Diagram of arch-type resonance cavity MIM filter

    Fig. 1. Diagram of arch-type resonance cavity MIM filter

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    Transmission spectra of arch-type cavity MIM structure filter

    Fig. 2. Transmission spectra of arch-type cavity MIM structure filter

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    Comparison of magnetic field distribution of arch-type resonance cavity structure filter. (a) λ=830 nm; (b) λ=1550 nm; (c) λ=1200 nm

    Fig. 3. Comparison of magnetic field distribution of arch-type resonance cavity structure filter. (a) λ=830 nm; (b) λ=1550 nm; (c) λ=1200 nm

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    Effect on transmission spectra and resonance wavelength distribution of arch-type resonator filter by changing structural parameter H. (a) Relation between transmission spectra and parameter H; (b) relation between resonance wavelength and parameter H

    Fig. 4. Effect on transmission spectra and resonance wavelength distribution of arch-type resonator filter by changing structural parameter H. (a) Relation between transmission spectra and parameter H; (b) relation between resonance wavelength and parameter H

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    Effect on transmission spectra and resonance wavelength distribution of arch-type resonator filter by changing structural parameter R. (a) Relation between transmission spectra and parameter R; (b) relation between resonance wavelength and parameter R

    Fig. 5. Effect on transmission spectra and resonance wavelength distribution of arch-type resonator filter by changing structural parameter R. (a) Relation between transmission spectra and parameter R; (b) relation between resonance wavelength and parameter R

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    Effect on transmission spectra and resonance wavelength distribution of arch-type resonator filter by changing dielectric refractive index n. (a) Relation between transmission spectra and insulator refractive index n; (b) relation between resonance wavelength and insulator refractive index n

    Fig. 6. Effect on transmission spectra and resonance wavelength distribution of arch-type resonator filter by changing dielectric refractive index n. (a) Relation between transmission spectra and insulator refractive index n; (b) relation between resonance wavelength and insulator refractive index n

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    Transmission spectra of optimized arch-type resonator filters

    Fig. 7. Transmission spectra of optimized arch-type resonator filters

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    Transmission spectra of two optimized structures and original structure. (a) Compared transmission spectra between optimized structure 1 and original structure; (b) compared transmission spectra between optimized structure 2 and original structure

    Fig. 8. Transmission spectra of two optimized structures and original structure. (a) Compared transmission spectra between optimized structure 1 and original structure; (b) compared transmission spectra between optimized structure 2 and original structure

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    • Table 1. Comparison of transmission characteristics with different filters

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      Table 1. Comparison of transmission characteristics with different filters

      StructureTransmittance (max)Transmittance (min)Max passband bandwidth /nmReference
      Arch-type cavity0.9761.39×10-4>700-
      Concave ring resonator0.960.01>700Ref. [27]
      Circular ring resonator0.910.02<400Ref. [18]
      Trapezoid resonator0.900.001<320Ref. [23]
      Rectangle cavity0.950.07<200Ref. [24]
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    Meng Wu, Xiyin Liang, Changlin Yan, Yunping Qi. Design of Arch-Type Resonance Cavity Filter Based on Surface Plasmon Polaritons[J]. Laser & Optoelectronics Progress, 2019, 56(20): 202417

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    Paper Information

    Category: Optics at Surfaces

    Received: Mar. 20, 2019

    Accepted: Apr. 16, 2019

    Published Online: Oct. 22, 2019

    The Author Email: Xiyin Liang (569613663@qq.com)

    DOI:10.3788/LOP56.202417

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology