Journal of Semiconductors, Volume. 45, Issue 4, 042801(2024)

Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li2MnO3 and Li2RuO3

Peng Zhang*
Author Affiliations
  • Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China
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    Peng Zhang. Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li2MnO3 and Li2RuO3[J]. Journal of Semiconductors, 2024, 45(4): 042801

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    Paper Information

    Category: Articles

    Received: Oct. 17, 2023

    Accepted: --

    Published Online: Jun. 21, 2024

    The Author Email: Peng Zhang (PZhang)

    DOI:10.1088/1674-4926/45/4/042801

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