Journal of Semiconductors, Volume. 45, Issue 4, 042801(2024)
Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li2MnO3 and Li2RuO3
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Peng Zhang. Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li2MnO3 and Li2RuO3[J]. Journal of Semiconductors, 2024, 45(4): 042801
Category: Articles
Received: Oct. 17, 2023
Accepted: --
Published Online: Jun. 21, 2024
The Author Email: Peng Zhang (PZhang)