Spectral Analysis of Changes in Photosynthetic Pigment Composition in Leaves of Sweet Cherry Tree Under Rain-Shelter Cultivation Based on

ZHANG Hui-min; HOU Qian-dong; WU Ya-wei; TU Kai; LI Quan; WEN Xiao-peng

doi:10.3964/j.issn.1000-0593(2021)04-1171-06

Spectroscopy and Spectral Analysis, Volume. 41, Issue 4, 1171(2021)

Spectral Analysis of Changes in Photosynthetic Pigment Composition in Leaves of Sweet Cherry Tree Under Rain-Shelter Cultivation Based on

ZHANG Hui-min^1,2、*, HOU Qian-dong², WU Ya-wei³, TU Kai², LI Quan⁴, and WEN Xiao-peng^1,2

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

⁴[in Chinese]

show less

References(7)

[1] [1] Cinta Pinzaru S, Müller Cs, Tomic S, et al. Journal of Raman Spectroscopy, 2015, 46(7): 597.

[3] [3] You W, Wang Z, Lu F, et al. Spectroscopy Letters, 2017, 50(7): 387.

[4] [4] Radu A I, Ryabchykov O, Bocklitz T W, et al. Analyst, 2016, 141: 4447.

[6] [6] Bhosale P, Ermakov I V, Ermakova M R, et al. Journal of Agricultural and Food Chemistry, 2004, 52(11): 3281.

[7] [7] Bicanic D, Dimitrovski D, Luterotti S, et al. Food Chemistry, 2010, 121(3): 832.

[8] [8] Juliano Antnio Sebben, Juliana da Silveira Espindola, Lucas Ranzan. Food Chemistry, 2017, 245: 1224.

[13] [13] Tamás Lóránd, József Deli, Péter Molnár. Helvetica Chimica Acta, 2002, 85(6): 1691.

Tools

Get Citation

Copy Citation Text

ZHANG Hui-min, HOU Qian-dong, WU Ya-wei, TU Kai, LI Quan, WEN Xiao-peng. Spectral Analysis of Changes in Photosynthetic Pigment Composition in Leaves of Sweet Cherry Tree Under Rain-Shelter Cultivation Based on[J]. Spectroscopy and Spectral Analysis, 2021, 41(4): 1171

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Received: Mar. 10, 2020

Accepted: --

Published Online: Apr. 12, 2021

The Author Email: Hui-min ZHANG (mhz722@126.com)

DOI:10.3964/j.issn.1000-0593(2021)04-1171-06

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology