Double sinusoidal phase modulating laser diode interferometer for thickness measurements of transparent plates

Dailin Li; Xiangzhao Wang; Yingming Liu

Chinese Optics Letters, Volume. 2, Issue 6, 06328(2004)

Dailin Li^*, Xiangzhao Wang, and Yingming Liu

Author Affiliations

Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

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References(7)

[1] [1] G. Coppola, P. Ferraro, M. Iodice, and S. De Nicola, Appl. Opt. 42, 3882 (2003).

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[7] [7] D. L. Li, X. Z. Wang, X. F. Wang, L. P. Guo, and Y. M. Liu, Chin. J. Lasers (in Chinese) 31, 350 (2004).

CLP Journals

[1] [in Chinese], [in Chinese], [in Chinese], "Study on silicon micro-resonators by using a novel optical excitation and detection apparatus," Chin. Opt. Lett. 4, 309 (2006)

[2] [in Chinese], [in Chinese]. A Single Optical Source System for Exciting and Detecting the Vibration of Silicon Microresonator Sensors[J]. Chinese Journal of Lasers, 2006, 33(12): 1661

[3] [in Chinese], [in Chinese]. Analysis of Modulation Frequency in Sinusoidal Phase Modulating Interferometry for Displacement Measurement[J]. Chinese Journal of Lasers, 2006, 33(11): 1574

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Dailin Li, Xiangzhao Wang, Yingming Liu, "Double sinusoidal phase modulating laser diode interferometer for thickness measurements of transparent plates," Chin. Opt. Lett. 2, 06328 (2004)

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Mar. 15, 2004

Accepted: --

Published Online: Jun. 6, 2006

The Author Email: Dailin Li (ldl@siom.ac.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology