Chinese Optics Letters, Volume. 2, Issue 6, 06328(2004)

Double sinusoidal phase modulating laser diode interferometer for thickness measurements of transparent plates

Dailin Li*, Xiangzhao Wang, and Yingming Liu
Author Affiliations
  • Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
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    Dailin Li, Xiangzhao Wang, Yingming Liu, "Double sinusoidal phase modulating laser diode interferometer for thickness measurements of transparent plates," Chin. Opt. Lett. 2, 06328 (2004)

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Mar. 15, 2004

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Dailin Li (ldl@siom.ac.cn)

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